Life Test Sampling Plans for Normal and Lognormal Distributions-Reference-Cited by-同舟云学术

Life Test Sampling Plans for Normal and Lognormal Distributions

Published:1962-05 Issue:2 Volume:4 Page:151-175
ISSN:0040-1706
Container-title:Technometrics
language:en
Short-container-title:Technometrics

Author:

Gupta Shanti S.

Publisher

Informa UK Limited

Subject

Applied Mathematics,Modeling and Simulation,Statistics and Probability

Link

http://www.tandfonline.com/doi/pdf/10.1080/00401706.1962.10490002

Reference12 articles.

1. Dodson, G. A. and Howard, B. T. “High stress aging to failure of semiconductor devices,”. Proceedings, Seventh National Symposium on Reliability and Quality Control. Philadelphia. January.

2. Truncated Life Tests in the Exponential Case

3. Goldthwaite, Lynn R. “Failure rate study for the lognormal lifetime model,”. Proceedings, Seventh National Symposium on Reliability and Quality Control in Electronics. Philadelphia. January. pp.208–213.

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