Statistical Modeling and Analysis of k-Layer Coverage of Two-Dimensional Materials in Inkjet Printing Processes-Reference-Cited by-同舟云学术

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Statistical Modeling and Analysis of k-Layer Coverage of Two-Dimensional Materials in Inkjet Printing Processes

Published:2020-09-14 Issue:3 Volume:63 Page:410-420
ISSN:0040-1706
Container-title:Technometrics
language:en
Short-container-title:Technometrics

Author:

Lee Jaesung¹,Zhou Shiyu¹,Chen Junhong²³

Affiliation:

1. Department of Industrial and Systems Engineering, University of Wisconsin–Madison, Madison, WI;

2. Pritzker School of Molecular Engineering, University of Chicago, Chicago, IL;

3. Chemical Sciences and Engineering Division, Physical Sciences and Engineering Directorate, Argonne National Laboratory, Lemont, IL

Publisher

Informa UK Limited

Subject

Applied Mathematics,Modelling and Simulation,Statistics and Probability

Link

https://www.tandfonline.com/doi/pdf/10.1080/00401706.2020.1805020

Reference28 articles.

1. Semi-quantitative design of black phosphorous field-effect transistor sensors for heavy metal ion detection in aqueous media

2. Stochastic Geometry and its Applications

3. Capillary flow as the cause of ring stains from dried liquid drops

4. All-Organic Vapor Sensor Using Inkjet-Printed Reduced Graphene Oxide

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Graphene oxide microstructure control of electrosprayed thin films;RSC Advances;2023

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