Ontology-guided attribute learning to accelerate certification for developing new printing processes-Reference-Cited by-同舟云学术

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Ontology-guided attribute learning to accelerate certification for developing new printing processes

Published:2023-09-27 Issue: Volume: Page:1-14
ISSN:2472-5854
Container-title:IISE Transactions
language:en
Short-container-title:IISE Transactions

Author:

Yhdego Tsegai O.¹,Wang Hui¹,Yu Zhibin¹,Chi Hongmei²

Affiliation:

1. Department of Industrial and Manufacturing Engineering, Florida A&M University- Florida State University College of Engineering, Tallahassee, FL, USA

2. Department of Computer and Information Sciences, Florida A&M University, Tallahassee, FL, USA

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/24725854.2023.2263786

Reference31 articles.

1. Label-embedding for image classification;Akata Z.;IEEE Transactions on Pattern Analysis and Machine Intelligence,,2015

2. Morphological dynamics-based anomaly detection towards in situ layer-wise certification for directed energy deposition processes;Bappy M.M.;Journal of Manufacturing Science and Engineering,,2022

3. In situ defect detection in selective laser melting via full-field infrared thermography

4. Defect inspection technologies for additive manufacturing;Chen Y.;International Journal of Extreme Manufacturing,,2021

5. A Statistical Transfer Learning Perspective for Modeling Shape Deviations in Additive Manufacturing

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