Stabilization of the electron probe current in the scanning electron microscope with a field emission cathode

Author:

CLEAVER J. R. A

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering

Reference9 articles.

1. Blunting of Tungsten Needles by Surface Diffusion

2. Field emission guns for electron probe instruments

3. CLEAVER , J. R. A. , and SMITH , K. C. A. , 1972 , Electron Microscopy, Inst, Phys. Conf. Ser. , 14 , 18 ; 1973,Scanning Electron Microscopy, Inst. Phys. Conf. Ser.18, 6 .

4. A High‐Resolution Scanning Transmission Electron Microscope

5. DYKE , W. P. , and DOLAN , W. W. , 1956 ,Adv. Electron. Electron Phys., edited by L. Marton , 8 , 89 .

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2. Notes and References;Principles of Electron Optics;2018

3. Notes and References for Volume 2;Principles of Electron Optics;1996

4. Development of a New Digital Fe SEM;Proceedings, annual meeting, Electron Microscopy Society of America;1990-08-12

5. Field emission SEM with wide operating voltage range;Proceedings, annual meeting, Electron Microscopy Society of America;1988

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