Mobile ion instability in SiO2films on silicon
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/00207217908901016
Reference36 articles.
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2. BURGES , T. E. , and FOWDES , F. M. , 1966 , Presented at the Spring Meeting of Electrochem. Soc., Cleveland (Ohio),1-6 May, Abstract No. 55 .
3. Tracer Evaluation of Hydrogen in Steam-Grown SiO[sub 2] Films
4. Application of Triangular Voltage Sweep Method to Mobile Charge Studies in MOS Structures
5. Cationic Migration in Silicon Dioxide Films on Silicon
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