1. Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor
2. Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits
3. Hamida, N. B. and Kaminska, B. ‘Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling’. Proceedings of International' Test Conference. pp.331–343.
4. Hasan, M. and Sun, Y. ‘Oscillation-based Test Structure and Method of Continuous-Time OTA-C Filters’. Proceedings of IEEE ICECS. December2006, Nice, France.
5. Hasan, M. and Sun, Y. ‘Design for Testability of KHN OTA-C Filters using Oscillation-Based Test’. Proceedings of IEEE APCCAS. September2006, Singapore.