A low-cost test strategy based on transient response method for embedded reconfigurable filters-Reference-Cited by-同舟云学术

A low-cost test strategy based on transient response method for embedded reconfigurable filters

Published:2020-07-22 Issue:4 Volume:108 Page:664-683
ISSN:0020-7217
Container-title:International Journal of Electronics
language:en
Short-container-title:International Journal of Electronics

Author:

Dri Emanuel A.¹^ORCID,Peretti Gabriela M.¹²^ORCID,Romero Eduardo A.¹²^ORCID

Affiliation:

1. Grupo de Estudio en Calidad en Mecatrónica, Universidad Tecnológica Nacional, Facultad Regional Villa María, Villa María, Argentina

2. Grupo de Desarrollo Electrónico e Instrumental, Universidad Nacional de Córdoba, Facultad de Matemática, Astronomía Y Física, Córdoba City, Argentina

Funder

Universidad Tecnológica Nacional

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/00207217.2020.1793412

Reference22 articles.

1. Built-in self-test of global interconnects of field programmable analog arrays

2. Functional Test of Field Programmable Analog Arrays

3. Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research and Application of a Multi-Field Co-Simulation Data Extraction Method Based on Adaptive Infinitesimal Element;Computer Modeling in Engineering & Sciences;2024

2. Soft Fault Diagnosis in Embedded Switched-Capacitor Filters;Circuits, Systems, and Signal Processing;2023-01-20

3. Adaptive co-simulation method and platform application of drive mechanism based on Fruit Fly Optimization Algorithm;Progress in Nuclear Energy;2022-11

4. A built-in self-test for analog reconfigurable filters implemented in a mixed-signal configurable processor;Analog Integrated Circuits and Signal Processing;2022-06-02

5. Fault detection in configurable switched-capacitor filters using transient analysis and dynamic time warping;Analog Integrated Circuits and Signal Processing;2021-05-28