High resolution x-ray diffraction methods for the structural characterisation of crystalline materials
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/00150199608244839
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1. X-ray scattering from critical fluctuations and domain walls in KDP and DKDP
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