Plan-view transmission electron microscopy observation of a crack tip in silicon
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Published:1995-10
Issue:4
Volume:72
Page:251-255
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ISSN:0950-0839
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Container-title:Philosophical Magazine Letters
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language:en
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Short-container-title:Philosophical Magazine Letters
Author:
Saka H.,Nagaya G.
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Cited by
43 articles.
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