Subpixel Speckle Displacement Measurement Using a Digital Processing Technique
Author:
Publisher
Informa UK Limited
Subject
Atomic and Molecular Physics, and Optics
Link
http://www.tandfonline.com/doi/pdf/10.1080/09500348814551271
Reference13 articles.
1. Speckle interferometry
2. Real-time displacement and tilt analysis by a speckle technique using Bi12SiO20-crystals
3. Butters, J.N. 1978.Speckle Metrology, Edited by: Erf, K. 111–157. New York: Academic Press.
4. Butters, J.N. and Leendertz, J.A. 1974.Proceedings of the Third Electro-optics International Conference43–50. (Kiver Communications)
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