Deep learning-based residual control chart for count data
Author:
Affiliation:
1. Statistics Discipline, Division of Science and Mathematics, University of Minnesota-Morris, Morris, Minnesota
2. Department of Statistics, Pukyong National University, Busan, South Korea
Funder
National Research Foundation of Korea (NRF) funded by the Ministry of Education
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality
Link
https://www.tandfonline.com/doi/pdf/10.1080/08982112.2022.2044049
Reference48 articles.
1. Control chart pattern recognition using RBF neural network with new training algorithm and practical features
2. Basic concepts of artificial neural network (ANN) modeling and its application in pharmaceutical research
3. Effect of neglecting autocorrelation in regression EWMA charts for monitoring count time series
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