On reliability analysis of one-shot devices with manufacturing defects
Author:
Affiliation:
1. Department of Statistical Science, Southern Methodist University, Dallas, Texas
2. Department of Mathematics and Information Technology, The Education University of Hong Kong, Hong Kong SAR, China
Funder
Simons Foundation
Faculty of Liberal Arts and Social Sciences, The Education University of Hong Kong, Hong Kong Special Administrative Region, China
the Research Grants Council of the Hong Kong Special Administrative Region, China
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality
Link
https://www.tandfonline.com/doi/pdf/10.1080/08982112.2022.2089855
Reference20 articles.
1. Reliability Test Plans for One-Shot Devices Based on Repeated Samples
2. Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress
3. Gamma lifetimes and one-shot device testing analysis
4. Robust Estimators and Test Statistics for One-Shot Device Testing Under the Exponential Distribution
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