Some Methods for Measurements on Thin Films-Reference-Cited by-同舟云学术

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Some Methods for Measurements on Thin Films

Published:1958-03-01 Issue:1-2 Volume:5 Page:47-52
ISSN:0030-3909
Container-title:Optica Acta: International Journal of Optics
language:en
Short-container-title:Optica Acta: International Journal of Optics

Author:

van Heel A.C.S.¹,Walther A.¹

Affiliation:

1. National Research Council, Ottawa

Publisher

Informa UK Limited

Subject

Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/713826242

Reference7 articles.

1. Étude et Application D'un InterfÉromètre à Polarisation

2. SCHUSTER, A. , 1928. An introduction lo the theory of optics . London: Arnold & Co; 1928. p. 213.

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical Thickness Monitor for Thin Film Deposition;Applied Optics;1975-04-01

2. Use of Savart Plates in Grating Interferometers;Applied Optics;1971-05-01

3. Progress in the production of optical multilayer films;Thin Solid Films;1969-10

4. Sets of Cascaded Plane-parallel Birefringent Crystal Plates;Optica Acta: International Journal of Optics;1969-07

5. Double-Layer Interference in Air-CdS Films*;Journal of the Optical Society of America;1966-09-01

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