Author:
Hansen Derek J.,Poignard Clair,Vogelius Michael S.
Subject
Applied Mathematics,Analysis
Reference11 articles.
1. A direct impedance tomography algorithm for locating small inhomogeneities
2. A general representation formula for boundary voltage perturbations caused by internal conductivity inhomogeneities of low volume fraction
3. Hansen, DJ. May 2007. May, Rutgers University. PhD Thesis
4. Hansen, DJ and Vogelius, MS. January 2006. “High frequency perturbation formulas for the effect of small inhomogeneities”. January, Rutgers University. Preprint
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