Deep learning for industrial image: challenges, methods for enriching the sample space and restricting the hypothesis space, and possible issue-Reference-Cited by-同舟云学术

Deep learning for industrial image: challenges, methods for enriching the sample space and restricting the hypothesis space, and possible issue

Published:2021-03-23 Issue: Volume: Page:1-30
ISSN:0951-192X
Container-title:International Journal of Computer Integrated Manufacturing
language:en
Short-container-title:International Journal of Computer Integrated Manufacturing

Author:

Liu Tianyuan¹,Bao Jinsong¹^ORCID,Wang Junliang¹,Wang Jiacheng¹

Affiliation:

1. College of Mechanical Engineering, Dong Hua University, Shanghai, China

Funder

National Natural Science Foundation of China

The Fundamental Research Funds for the Central Universities and Graduate Student Innovation Fund of Donghua University

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering,Computer Science Applications,Mechanical Engineering,Aerospace Engineering

Link

Reference171 articles.

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