Author:
Thomas L. E.,Schober T.,Balluffi R. W.
Reference26 articles.
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3. Elektronenmikroskopische Untersuchung von Fehlstellen-agglomeraten in ionenbestrahlten Kupferfolien. I. Analyse von Agglomerattyp und -konfiguration
4. The penetration of lattice defects in copper and gold foils bombarded with 1–5 keV argon ions
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