1. Lentz, R., et al. March 28, 1989. Method and apparatus for measuring strong microw ave electric-field strengths. U.S. Patent No. 4,816,634. (Luxtron has licensed this patent exclusively. Other Luxtron applications are in process.)
2. Randa, J. et al. 1988. Possible designs for electric-field strength probes for millimeter waves. NBSIR 88–3084.
3. Randa, R., et al. 1989. Thermo-optic designs for millimeter-wave electric-field probes. IEEE National Symposium EMC, Denver, Colorado 7–11.
4. Sun, M., et al. 1986. Improved techniques for small area temperature measurements on operating electronic devices. Semi-Therm Symp., Scottsdale, Arizona, Dec. 9–11.
5. Wickersheim, K., et al. 1989. Fiberoptic sensing techniques for use in high frequency/microwave processing and heating applications. Proc. KEMA Intl. Conf. on High Frequency/Microwave Processing and Heating, Arnhem, The Netherlands, Sept. 26-29, 3-4-1 to 3-4–10.