Analysis of quality-caused re-entrance electrical test system in semiconductor manufacturing by Markov method-Reference-Cited by-同舟云学术

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Analysis of quality-caused re-entrance electrical test system in semiconductor manufacturing by Markov method

Published:2011-09-21 Issue:12 Volume:50 Page:3486-3497
ISSN:0020-7543
Container-title:International Journal of Production Research
language:en
Short-container-title:International Journal of Production Research

Author:

Li N.¹,Jiang Z.¹,Liu G.²,Zhang Z.³

Affiliation:

1. Department of Industrial Engineering, Shanghai Jiao Tong University, Shanghai, China

2. Solver Solution Engineering Team, Intel Corporation, Chengdu, China

3. Department of Industrial Engineering, Dongguan University of Technology, Dongguan, China

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management

Link

https://www.tandfonline.com/doi/pdf/10.1080/00207543.2011.588628

Reference25 articles.

1. The impact of defects on a process with rework

2. Estimating manufacturing cycle time and throughput in flow shops with process drift and inspection

3. Exact analysis of a discrete material three-station one-buffer merge system with unreliable machines

4. An approximate analytical method for evaluating the performance of closed-loop flow systems with unreliable machines and finite buffers

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