Optimum lot inspection based on lognormal reliability tests
Author:
Affiliation:
1. Departamento de Matemáticas, Estadística e Investigación Operativa, Universidad de La Laguna, La Laguna, Spain
Funder
Ministry of Science and Innovation (MICINN) of Spain
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management
Link
https://www.tandfonline.com/doi/pdf/10.1080/00207543.2022.2036852
Reference64 articles.
1. Optimal Simple Step-Stress Plan for Cumulative Exposure Model Using Log-Normal Distribution
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4. Optimum life test plan for Type-I hybrid censored Weibull distributed products sold under general rebate warranty
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