Automated sampling decision scheme for the AVM system-Reference-Cited by-同舟云学术

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Automated sampling decision scheme for the AVM system

Published:2015-08-07 Issue:21 Volume:54 Page:6351-6366
ISSN:0020-7543
Container-title:International Journal of Production Research
language:en
Short-container-title:International Journal of Production Research

Author:

Cheng Fan-Tien,Hsieh Yao-Sheng,Chen Chun-Fang,Lyu Jhao-Rong

Funder

Ministry of Science and Technology of the Republic of China

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management

Link

http://www.tandfonline.com/doi/pdf/10.1080/00207543.2015.1072649

Reference10 articles.

1. Evaluating Reliance Level of a Virtual Metrology System

2. Dual-Phase Virtual Metrology Scheme

3. Developing an Automatic Virtual Metrology System

4. Tutorial on Applying the VM Technology for TFT-LCD Manufacturing

5. A Fab-Wide APC Sampling Application

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1. Virtual metrology for enabling zero-defect manufacturing: a review and prospects;The International Journal of Advanced Manufacturing Technology;2024-01-09

2. Bayesian decision analysis for optimizing in-line metrology and defect inspection strategy for sustainable semiconductor manufacturing and an empirical study;Computers & Industrial Engineering;2023-08

3. True sparse PCA for reducing the number of essential sensors in virtual metrology;International Journal of Production Research;2023-05-28

4. Data-based model maintenance in the era of industry 4.0: A methodology;Journal of Manufacturing Systems;2022-04

5. Virtual metrology as an approach for product quality estimation in Industry 4.0: a systematic review and integrative conceptual framework;International Journal of Production Research;2021-09-21

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