Evaluation of fullerenes C60/C70 layers in polystyrene thin films by neutron and X-ray reflectometry-Reference-Cited by-同舟云学术

Evaluation of fullerenes C60/C70 layers in polystyrene thin films by neutron and X-ray reflectometry

Author:

Tropin Timur V.¹^ORCID,Karpets Maksym L.²³^ORCID,Kosiachkin Yehor¹⁴^ORCID,Gapon Igor V.¹⁵^ORCID,Gorshkova Yulia E.¹⁶^ORCID,Aksenov Victor L.¹⁷^ORCID

Affiliation:

1. Frank Laboratory of Neutron Physics, Joint Institute for Nuclear Research, Dubna, Russia

2. Institute of Experimental Physics, Slovak Academy of Sciences, Košice, Slovakia

3. Faculty of Electrical Engineering and Informatics, Technical University of Košice, Košice, Slovakia

4. Faculty of Physics, Taras Shevchenko National University of Kyiv, Kyiv, Ukraine

5. Institute for Safety Problems of Nuclear Power Plants, NAS Ukraine, Chornobyl, Ukraine

6. Institute of Physics, Kazan Federal University, Kazan, Russia

7. National Research Center “Kurchatov Institute”, Moscow, Russia

Funder

JINR-Poland

JINR – Romania

Publisher

Informa UK Limited

Subject

Organic Chemistry,Physical and Theoretical Chemistry,General Materials Science,Atomic and Molecular Physics, and Optics

Link

Reference28 articles.

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3. Neutron scattering studies of nanoscale polymer-based coatings;Polymer-Based Nanoscale Materials for Surface Coatings;2023