A survey of dispatching rules for operational control in wafer fabrication
Author:
Affiliation:
1. a Grado Department of Industrial and Systems Engineering , Virginia Tech , Blacksburg, VA 24061, USA
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management,Computer Science Applications
Link
https://www.tandfonline.com/doi/pdf/10.1080/09537287.2010.490014
Reference91 articles.
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3. A spatial rule adaptation procedure for reliable production control in a wafer fabrication system
4. Bahaji , N and Kuhl , ME . 2008. A simulation study of new multi-objective composite dispatching rules, CONWIP, and push lot release in semiconductor fabrication.International Journal of Production Research, 46 (14), 3801–3824
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