Phase formation sequences in the silicon-phosphorus system: Determined by in-situ synchrotron and conventional X-ray diffraction measurements and predicted by a theoretical model-Reference-Cited by-同舟云学术

Phase formation sequences in the silicon-phosphorus system: Determined by in-situ synchrotron and conventional X-ray diffraction measurements and predicted by a theoretical model

Published:1997-03 Issue:3 Volume:75 Page:363-376
ISSN:1364-2812
Container-title:Philosophical Magazine B
language:en
Short-container-title:Philosophical Magazine B

Author:

Carlsson J. R. A.¹,Clevenger L.¹,Madsen L. D.¹,Hultman L.¹,Li X.-H.¹,Jordan-Sweet J.²,Lavoie C.²,Roy R. A.²,Cabral C.²,Morales G.³,Ludwigš K. L.³,Stephenson G. B.²,Hentzell H. T.G.¹

Affiliation:

1. a Thin Film Division, Department of Physics , Linköping University , S-581 83, Linköping , Sweden

2. b IBM T. J. Watson Research Center , Yorktown Heights, New York , 10598 , USA

3. c Department of Physics , Boston University , Boston , Massachusetts , 02215 , USA

Publisher

Informa UK Limited

Subject

General Physics and Astronomy,General Chemical Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/13642819708202324

Reference14 articles.

1. PhD Thesis;Carlsson J. R. A.,1995

2. Nucleation of a new phase from the interaction of two adjacent phases: Some silicides

3. Growth kinetics of planar binary diffusion couples: ’’Thin‐film case’’ versus ’’bulk cases’’

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