In-profile monitoring for cluster-correlated data in advanced manufacturing system-Reference-Cited by-同舟云学术

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In-profile monitoring for cluster-correlated data in advanced manufacturing system

Published:2022-08-16 Issue:2 Volume:55 Page:195-219
ISSN:0022-4065
Container-title:Journal of Quality Technology
language:en
Short-container-title:Journal of Quality Technology

Author:

Liu Peiyao¹^ORCID,Du Juan²³^ORCID,Zang Yangyang⁴^ORCID,Zhang Chen¹^ORCID,Wang Kaibo¹^ORCID

Affiliation:

1. Department of Industrial Engineering, Tsinghua University, Beijing, P.R. China

2. Smart Manufacturing Thrust, Systems Hub, The Hong Kong University of Science and Technology, Guangzhou, P.R. China

3. Department of Mechanical and Aerospace Engineering, The Hong Kong University of Science and Technology, Hong Kong SAR, China

4. AVIC China Aero-Polytechnology Establishment, Beijing, P.R. China

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management,Safety, Risk, Reliability and Quality

Link

https://www.tandfonline.com/doi/pdf/10.1080/00224065.2022.2106912

Reference41 articles.

1. Optimal Filtering

2. Ando, R. K, and T. Zhang. 2007. Learning on graph with Laplacian regularization. In Advances in neural information processing systems, 25–32.

3. Bayesian Reasoning and Machine Learning

4. Solution of the matrix equation AX + XB = C [F4]

5. Berndt, D. J, and J. Clifford. 1994. Using dynamic time warping to find patterns in time series. in KDD workshop, Seattle, WA, vol. 10, 359–70.

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