Yield-based process capability indices for nonnormal continuous data
Author:
Affiliation:
1. Industrial Systems Engineering and Management, National University of Singapore, Singapore, Singapore;
2. Department of Statistics, Zhejiang Gongshang University, Hangzhou, China
Funder
National Natural Science Foundation of China
Zhejiang Provincial Natural Science Foundation of China
Zhejiang Gongshang University–Statistics
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management,Safety, Risk, Reliability and Quality
Link
https://www.tandfonline.com/doi/pdf/10.1080/00224065.2019.1571342
Reference35 articles.
1. Six Sigma performance for non-normal processes
2. Bandwidth selection for kernel distribution function estimation
3. Interval estimation of capability index Cpmk for manufacturing processes with asymmetric tolerances
4. Comparing the Capability of Two Processes Using Cpm
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