An Introduction to Statistical Issues and Methods in Metrology for Physical Science and Engineering
Author:
Affiliation:
1. Iowa State University, Ames, IA 50011
2. Los Alamos National Laboratory, Los Alamos, NM 87545
3. Miami University, Oxford, OH 45056
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management,Safety, Risk, Reliability and Quality
Link
https://www.tandfonline.com/doi/pdf/10.1080/00224065.2014.11917953
Reference29 articles.
1. Bayes one-sample and one-way random effects analyses for 3-D orientations with application to materials science
2. Rounding error effects in the presence of underlying measurement error
3. Measurement error models and variance estimation in the presence of rounding error effects
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