Planning accelerated life tests with multiple sources of random effects
Author:
Affiliation:
1. Department of Industrial and Manufacturing Systems Engineering; Department of Statistics, University of Missouri, Columbia, Missouri
2. School of Computing, Informatics, and Decision Systems Engineering, Arizona State University, Tempe, Arizona
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management,Safety, Risk, Reliability and Quality
Link
https://www.tandfonline.com/doi/pdf/10.1080/00224065.2020.1829214
Reference36 articles.
1. Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution
2. A Limited Memory Algorithm for Bound Constrained Optimization
3. Optimal design for linear models with correlated observations
4. Design of PH-based accelerated life testing plans under multiple-stress-type
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