Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films
Author:
Affiliation:
1. a Donnelly Corporation , 4545 East Fort Lowell Road, Tucson, AZ, 85712
2. b Department of Materials Science and Engineering , University of Arizona , Tucson, AZ, 85721
Publisher
Informa UK Limited
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/10584589708012996
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1. SOLID SOLUTIONS OF Pb(Ti, Zr, Sn, Hf)O3
2. Properties of sputter-deposited PbTiO3, Pb(Zr,Ti)O3, Pb2KNb5O15films
3. PbTiO/sub 3/ films from metalloorganic precursors
4. Compositional analysis of lead titanate thin films by Auger electron spectroscopy and their electrical properties
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