Analysis of preferred orientations in PST and PZT thin films on various substrates-Reference-Cited by-同舟云学术

Analysis of preferred orientations in PST and PZT thin films on various substrates

Published:1998-04 Issue:1-4 Volume:19 Page:121-140
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Chateigner D.¹²,Wenk H.-R.¹²,Patel A.³,Todd M.⁴,Barber D. J.⁵⁶

Affiliation:

1. a Laboratoire de Cristallographie-CNRS , BP 166, 38042, Grenoble, France

2. b Department of Geology and Geophysics , Univ. of California , Berkeley, CA, 94720, USA

3. c GEC-Marconi Materials Technology Limited , Northamptonshire, NN12 8EQ, U. K

4. d Defence Research Agency , Malvern, Worcestershire, U. K

5. e Department of physics , Hong Kong Univ. of Science and Technology , Hong Kong

6. f School of Industrial and Manufacturing Science, Cranfield Univ. , Cranfield, Bedfordshire, MK430AL, U. K.

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589808012699

Reference20 articles.

1. Textures of laser ablated superconducting thin films of YBa2Cu3O7−δ as a function of deposition temperature

2. Texture influence on critical current density of YBCO films deposited on (100)-MgO substrates

3. Epitaxial growth of sol-gel PLZT thin films

4. Preparation and properties of (Pb,La)(Zr,Ti)O3thin films by metalorganic chemical vapor deposition

5. Microstructural Evolution of Pb(Zr,Ti)O3 Ceramics Using Electron Paramagnetic Resonance

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