Characterization of PZT capacitors with SrRuO3 electrodes-Reference-Cited by-同舟云学术

Characterization of PZT capacitors with SrRuO3 electrodes

Published:1998-09 Issue:1-4 Volume:21 Page:263-271
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Cross Jeffrey S.¹,Fujiki Mitsushi¹,Tsukada Mineharu¹,Kotaka Yasutoshi¹,Goto Yasuyuki¹

Affiliation:

1. a Materials and Materials Engineering Laboratory , Fujitsu Laboratories, Ltd. , 10-1 Morinosato-wakamiya, Atsugi , 243-0197 , JAPAN

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589808202069

Reference10 articles.

1. Single-Crystal Epitaxial Thin Films of the Isotropic Metallic Oxides Sr 1– x Ca x RuO 3 (0 ≤ × ≤ 1)

2. Single-crystal Pb(ZrxTi1−x)O3 thin films prepared by metal-organic chemical vapor deposition: Systematic compositional variation of electronic and optical properties

3. La0.5Sr0.5CoO3 electrode technology for Pb(Zr,Ti)O3 thin film nonvolatile memories

4. Thickness dependence of the switching voltage in all-oxide ferroelectric thin-film capacitors prepared by pulsed laser deposition

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