Characterization of Pb(Zr,Ti)O3 thin films by MOCVD using the total reflection X-ray diffraction method-Reference-Cited by-同舟云学术

Characterization of Pb(Zr,Ti)O3 thin films by MOCVD using the total reflection X-ray diffraction method

Published:1997-02 Issue:1-4 Volume:15 Page:1-8
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Fujisawa Hironori¹,Shimizu Masaru¹²,Shiosaki Tadashi¹

Affiliation:

1. a Department of Electronic Science and Engineering, Faculty of Engineering , Kyoto University , Yoshida Honmachi, Sakyo-ku, Kyoto, 606-01, Japan

2. b Department of Electronics , Faculty of Engineering, Himeji Institute of Technology , 2167 Shosha, Himeji, Hyogo, 671-22, Japan

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589708015691

Reference14 articles.

1. New Evaluation Method of Evaporated Organic Thin Films by Energy Dispersive X-Ray Diffractometer

2. In-SituX-Ray Observation of Molecular Structure in Organic Thin Films during Evaporation Process by Total Reflection In-Plane X-Ray Diffractometer

3. Structural evaluation of epitaxially grown organic evaporated films by total reflection x‐ray diffractometer

4. Formation of Epitaxial Twins by Perfluoro-N-Alkane Evaporated on Alkali Halide Crystal

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effects of film thickness and grain size on the electrical properties of Pb(Zr,Ti)O3thin films prepared by MOCVD;Ferroelectrics;2000-03

2. Size Effects of Epitaxial and Polycrystalline Pb(Zr, Ti)O3Thin Films Grown by Metalorganic Chemical Vapor Deposition;Japanese Journal of Applied Physics;1999-09-30