Intensity Correlation Metrology: A Comparative Study
Author:
Affiliation:
1. a Central Institute for Industrial Research, P. O. Box 350, Blindern, Oslo 3, Norway
Publisher
Informa UK Limited
Subject
Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/713820736
Reference31 articles.
1. Electronic speckle pattern interferometry
2. LAIIEYRIE , A. 1976.Progress in Optics, Edited by: Wolf , E. Vol. XIV, 47–87. Amsterdam: North-Holland. See, for example
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