Quantification of critical alignment parameters for a rotationally-shearing interferometer employing exact ray trace
Author:
Publisher
Informa UK Limited
Subject
Atomic and Molecular Physics, and Optics
Link
http://www.tandfonline.com/doi/pdf/10.1080/09500341003693003
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1. Method for calibrating system parameters of a multidirectional interferometers system
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5. Line-shape distortions in misaligned cube corner interferometers
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