Modified Shewhart Charts for High Yield Processes
Author:
Publisher
Informa UK Limited
Subject
Statistics, Probability and Uncertainty,Statistics and Probability
Link
http://www.tandfonline.com/doi/pdf/10.1080/10256018808623883
Reference25 articles.
1. Detecting a Shift in Fraction Nonconforming Using Run-Length Control Charts with 100% Inspection
2. Performance of cumulative sum schemes for monitoring low count-level processes
3. Sample size and the Binomial CUSUM Control Chart: the case of 100% inspection
4. An approach to the probability distribution of cusum run length
5. Quality Control Techniques for "Zero Defects"
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