Quantitative study of isoelectronic copper pairs by photoluminescence and deep level transient spectroscopy-Reference-Cited by-同舟云学术

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Quantitative study of isoelectronic copper pairs by photoluminescence and deep level transient spectroscopy

Published:1995-07 Issue:7 Volume:11 Page:676-679
ISSN:0267-0836
Container-title:Materials Science and Technology
language:en
Short-container-title:Materials Science and Technology

Author:

Erzgräber H.B.¹,Schmalz K.¹

Affiliation:

1. Institute of Semiconductor Physics, Frankfurt an der Oder, Germany.

Publisher

Informa UK Limited

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Link

https://www.tandfonline.com/doi/pdf/10.1080/17432847.1995.11945562

Reference2 articles.

1. P. STALLHOFER, A. HUBER, P. BLÖCHL, and H. SCHWENK: in Proc. 6th Int. Symp. on ‘Si materials science and technology’, (ed. H. R. Huff et al.), 1016-1028; 1990, Pennington, NJ, The Electrochemical Society.

2. K. GRAFF and H. PIEPER: in Proc. 4th Int. Symp. on ‘Si materials science and technology’, (ed. H. R. Huff et al.), 331-343; 1981, Pennington, NJ, The Electrochemical Society.

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