Real-Time Spectroscopic Ellipsometric Studies of Photo-Assisted Chemical Processes
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1080/10587250108024749
Reference10 articles.
1. Nondestructive depth profiling by spectroscopic ellipsometry
2. Spectroscopic ellipsometry: a historical overview
3. A Computer-Operated Following Ellipsometer
4. A study of amorphous semiconductor interfaces by spectroscopic ellipsometry
5. Microstructural evolution of ultrathin amorphous silicon films by real-time spectroscopic ellipsometry
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1. Morphological Development and Etching of Gold Thin Film under UV-exposure in Chlorine-based Liquids;Chemistry Letters;2004-10
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