In-plane Thermal Conductivity Measurement with Nanosecond Grating Imaging Technique-Reference-Cited by-同舟云学术

In-plane Thermal Conductivity Measurement with Nanosecond Grating Imaging Technique

Author:

Jeong Jihoon¹^ORCID,Chen Ke¹,Walker Emily S.²,Roy Nilabh¹,He Feng³,Liu Philip³⁴,Willson C. Grant³⁴⁵,Cullinan Michael¹,Bank Seth R.²,Wang Yaguo¹³

Affiliation:

1. Department of Mechanical Engineering, The University of Texas at Austin, Austin, USA

2. Department of Electrical and Computer Engineering, Microelectronic Research Center, The University of Texas at Austin, Austin, USA

3. Texas Materials Institute, The University of Texas at Austin, Austin, USA

4. Department of Chemistry, The University of Texas at Austin, Austin, USA

5. McKetta Department of Chemical Engineering, The University of Texas at Austin, Austin, USA

Funder

Division of Chemical, Bioengineering, Environmental, and Transport Systems

Division of Engineering Education and Centers

Division of Materials Research

Publisher

Informa UK Limited

Subject

Mechanics of Materials,Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics

Link

Reference45 articles.

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2. Advanced topics;Transport Phenomena in Micro- and Nanoscale Functional Materials and Devices;2021