The Source Width and Its Influence on Interference Phenomena in a Fresnel Electron Bi-prism
Author:
Affiliation:
1. a Institute of Instrument Technology, Laboratory of Electron Optics, Czechoslovak Academy of Science, Brno, Czechoslovakia
Publisher
Informa UK Limited
Subject
Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/713817876
Reference10 articles.
1. JENKINS , F. A. and WHITE , H. E. 1957. Fundamentals of Optics, 321New York: McGraw-Hill.
2. BOUASSE , H. and CARRIkRE , Z. 1923. Interferences, 91Paris: Librairie Delagrave.
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