Reliability Prediction Methods for Electronic Devices: A State-of-the-art Review
Author:
Affiliation:
1. National Institute of Technology Jamshedpur, Jharkhand, India
2. Computer Science & Engineering Department, Indian Institute of Technology (BHU), Varanasi 221005, India
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/02564602.2020.1843552
Reference39 articles.
1. Survey on Reliability of Power Electronic Systems
2. Electronic System Reliability: Collating Prediction Models
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4. J. Harms, and W. Jeffrey. “Revision of MIL-HDBK-217, reliability prediction of electronic equipment.” in Reliability and Maintainability Symposium (RAMS), 2010 Proceedings-Annual, IEEE, 2010, pp. 1–3.
5. L. Yanjun, and W. Wei. “Research on the system of reliability block diagram design and reliability prediction,” in System Science, Engineering Design and Manufacturing Informatization (ICSEM), 2011 International Conference on, vol. 2, IEEE, 2011, pp. 35–8.
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