Determination of warranty length for one-shot devices with Rayleigh lifetime distribution-Reference-Cited by-同舟云学术

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Determination of warranty length for one-shot devices with Rayleigh lifetime distribution

Published:2021-05-23 Issue: Volume: Page:1-17
ISSN:0361-0926
Container-title:Communications in Statistics - Theory and Methods
language:en
Short-container-title:Communications in Statistics - Theory and Methods

Author:

Wu Shuo-Jye¹^ORCID,Huang Syuan-Rong²^ORCID,Wang Jie-Huei³^ORCID

Affiliation:

1. Department of Statistics, Tamkang University, New Taipei City, Taiwan

2. Computer Integrated Manufacturing Division, Vanguard International Semiconductor Corporation, Hsinchu, Taiwan

3. Department of Statistics, Feng Chia University, Taichung, Taiwan

Funder

Ministry of Science and Technology

Publisher

Informa UK Limited

Subject

Statistics and Probability

Link

https://www.tandfonline.com/doi/pdf/10.1080/03610926.2021.1927755

Reference39 articles.

1. Bayesian prediction for type-II progressive-censored data from the Rayleigh distribution under progressive-stress model

2. The Relationship Between Warranty and Product Reliability

3. Statistical analysis of Rayleigh competing risks model based on partially step stress Type-II censoring samples

4. Bayesian inference for pareto populations

5. Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An analysis of one-shot devices with multiple components;Developments in Reliability Engineering;2024

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