Prediction of Times to Failure of Censored Items for a Simple Step-Stress Model with Regular and Progressive Type I Censoring from the Exponential Distribution-Reference-Cited by-同舟云学术

Prediction of Times to Failure of Censored Items for a Simple Step-Stress Model with Regular and Progressive Type I Censoring from the Exponential Distribution

Published:2014-05-13 Issue:10-12 Volume:43 Page:2322-2341
ISSN:0361-0926
Container-title:Communications in Statistics - Theory and Methods
language:en
Short-container-title:Communications in Statistics - Theory and Methods

Author:

Basak Indrani

Publisher

Informa UK Limited

Subject

Statistics and Probability

Link

http://www.tandfonline.com/doi/pdf/10.1080/03610926.2013.861489

Reference13 articles.

1. A synthesis of exact inferential results for exponential step-stress models and associated optimal accelerated life-tests

2. Progressive censoring methodology: an appraisal

3. Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under Type-II censoring

4. Point and Interval Estimation for a Simple Step-Stress Model with Type-II Censoring

5. Exact inference for a simple step-stress model with Type-II hybrid censored data from the exponential distribution

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1. On Point Prediction of New Lifetimes Under a Simple Step-Stress Model for Censored Lomax Data;Mathematics and Computation;2023

2. Prediction of Future Lifetimes for a Simple Step-Stress Model with Type-II Censoring and Rayleigh Distribution;WSEAS TRANSACTIONS ON MATHEMATICS;2022-03-24

3. Dynamic stress–strength reliability estimation of system with survival signature;Statistical Theory and Related Fields;2018-07-03

4. A Note on the Prediction of Censored Exponential Lifetimes in a Simple Step-stress Model with Type-II Censoring;Calcutta Statistical Association Bulletin;2018-05

5. Statistical prediction of failure times under generalized progressive hybrid censoring in a simple step-stress accelerated competing risks model;Journal of Systems Engineering and Electronics;2017