Determination of the C70/C60 ratio in fullerene thin film as a function of the sublimation distance and the substrate temperature using scanning tunnelling microscopy-Reference-Cited by-同舟云学术

Determination of the C70/C60 ratio in fullerene thin film as a function of the sublimation distance and the substrate temperature using scanning tunnelling microscopy

Published:1994-09 Issue:3 Volume:70 Page:721-730
ISSN:1364-2812
Container-title:Philosophical Magazine B
language:en
Short-container-title:Philosophical Magazine B

Author:

Lang H. P.¹,Heeger K. M.²,Thommen-geiser V.¹,Güntherodt H.-J.¹

Affiliation:

1. a Institute of Physics, University of Basel , Klingelbergstrasse 82, CH-4056 , Basel , Switzerland

2. b St Edmund Hall, University of Oxford , Oxford , OX 14AR , England

Publisher

Informa UK Limited

Subject

General Physics and Astronomy,General Chemical Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/01418639408240245

Reference23 articles.

1. Vapor pressure of Buckminsterfullerene

2. Characterization of the soluble all-carbon molecules C60 and C70

3. Mass Spectrometric, Thermal, and Separation Studies of Fullerenes

4. Crystal structure and bonding of ordered C60

5. Compressibility of Solid C 60

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1. Amorphization of C60 fullerite by applying pressure in the GPa range using a scanning tunneling microscope: Observation of transitions and aging;Journal of Physics and Chemistry of Solids;1997-11

2. Study of C60 thin films by scanning tunnelling microscopy: pressure-induced transformation to an amorphous carbon phase;Synthetic Metals;1996-02

3. MORPHOLOGY AND ORIENTATIONAL DISORDER OF C-70 SINGLE-CRYSTALS;APPL PHYS A-MATER;1995

4. Morphology and orientational disorder of C70 single crystals;Applied Physics A Materials Science & Processing;1995-07