Thin-film quantitative microanalysis of the cation composition in ceramics with ultrathin-window-type energy-dispersive X-ray spectroscopy in a transmission electron microscope-Reference-Cited by-同舟云学术

Thin-film quantitative microanalysis of the cation composition in ceramics with ultrathin-window-type energy-dispersive X-ray spectroscopy in a transmission electron microscope

Published:1997-07 Issue:1 Volume:76 Page:23-45
ISSN:1364-2812
Container-title:Philosophical Magazine B
language:en
Short-container-title:Philosophical Magazine B

Author:

Kondoh Junya¹,Kikuchi Shiomi²,Timii Yoichi³,Ito Yasuhiko¹

Affiliation:

1. a Department of Energy Science and Engineering , Graduate School of Engineering, Kyoto University , Sakyo-Ku, Kyoto , 606-01 , Japan

2. b Department of Materials Science , School of Engineering, The University of Shiga Prefecture , 2500 Hassaka, Hikone , Shiga , 522 , Japan

3. c Division of Materials Science and Engineering , Graduate School of Engineering, Kyoto University , Sakyo-Ku, Kyoto , 606-01 , Japan

Publisher

Informa UK Limited

Subject

General Physics and Astronomy,General Chemical Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/01418639708241076

Reference33 articles.

1. Chemical analysis of small supported PtRu bimetallic clusters by EDS

2. Application of stem to elemental analysis in glass

3. Elemental analysis in a phase-separated glass by stem X-ray microanalysis

4. A Newly Developed 300 kV Field-Emission Analytical Transmission Electron Microscope

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