Scanning Near-Field Optical Microscopy of Light Emitting Semiconductor Nanostructures-Reference-Cited by-同舟云学术

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Scanning Near-Field Optical Microscopy of Light Emitting Semiconductor Nanostructures

Published:2015-03-12 Issue:1 Volume:477 Page:65-76
ISSN:0015-0193
Container-title:Ferroelectrics
language:en
Short-container-title:Ferroelectrics

Author:

Ankudinov A. V.,Mintairov A. M.,Slipchenko S.O.,Shelaev A.V.,Yanul M.L.,Dorozhkin P. S.,Vishnyakov N.V.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/00150193.2015.999632

Reference19 articles.

1. Scanning near-field optical microscopy with aperture probes: Fundamentals and applications

2. Near-field optical fiber probe optimized for illumination–collection hybrid mode operation

3. Scanning Near-Field Raman Spectroscopic Microscope

4. Single Semiconductor Quantum Dots

5. 20W continuous wave reliable operation of 980nm broad-area single emitter diode lasers with an aperture of 96μm

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Mapping near-field plasmonic interactions of silver particles with scanning near-field optical microscopy measurements;SPIE Proceedings;2015-08-28

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