Scanning capacitance microscopy of TGS − TGS + Cr ferroelectric crystals-Reference-Cited by-同舟云学术

Scanning capacitance microscopy of TGS − TGS + Cr ferroelectric crystals

Published:2019-03-12 Issue:1 Volume:541 Page:39-46
ISSN:0015-0193
Container-title:Ferroelectrics
language:en
Short-container-title:Ferroelectrics

Author:

Gainutdinov R. V.¹,Belugina N. V.¹,Lashkova A. K.¹,Shut V. N.²,Kashevich I. F.³,Mozzharov S. E.²,Tolstikhina A. L.¹

Affiliation:

1. Shubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia;

2. Institute of Technical Acoustic, The National Academy of Sciences of Belarus, Vitebsk, Belarus;

3. Vitebsk State University, Department of Mathematics and IT, Vitebsk, Belarus

Funder

Ministry of Science and Higher Education

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/00150193.2019.1574640

Reference17 articles.

1. Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy

2. Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale

3. Advances in AFM for the electrical characterization of semiconductors

4. Atomic force microscopy modified for studying electric properties of thin films and crystals. Review

5. Scanning capacitance microscopy for thin film measurements

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