Bootstrap confidence intervals of generalized process capability index Cpyk for Lindley and power Lindley distributions

Author:

Dey Sanku1,Saha Mahendra2,Maiti Sudhansu S.3,Jun Chi-Hyuck4

Affiliation:

1. Department of Statistics, St. Anthony’s College, Shillong, Meghalaya, India

2. Department of Statistics, Central University of Rajasthan, Rajasthan, India

3. Department of Statistics, Visva-Bharati University, Santiniketan, West Bengal, India

4. Department of Industrial & Management Engineering, POSTECH, Republic of Korea

Publisher

Informa UK Limited

Subject

Modeling and Simulation,Statistics and Probability

Reference43 articles.

Cited by 40 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Inference on process capability index $$S_{pmk}$$ for a new lifetime distribution;Soft Computing;2024-07-24

2. Classical Inference of a New PCI CNpmkc for Logistic-Exponential Process Distribution;International Journal of Reliability, Quality and Safety Engineering;2024-05-20

3. Statistical Inference on Process Capability Index Cpyk for Inverse Rayleigh Distribution under Progressive Censoring;Pakistan Journal of Statistics and Operation Research;2024-03-07

4. Applications of a new loss and cost-based process capability index to electronic industries;Communications in Statistics: Case Studies, Data Analysis and Applications;2023-09-04

5. Bootstrap confidence intervals of process capability indices Spmk, Spmkc and Cs for Frechet distribution;Quality and Reliability Engineering International;2023-04-07

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