Increments at the Interface between Layers during Infra-red Filter Manufacture
Author:
Affiliation:
1. a Department of Engineering and Cybernetics, University of Reading
Publisher
Informa UK Limited
Subject
Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/713819255
Reference9 articles.
1. USAF Contract 61(052)-833;SMITH S. D.,1968
2. PROPERTIES OF THICK EVAPORATED LAYERS OF PbTe
3. Optical thickness changes in freshly deposited layers of lead telluride
4. Turning Value Monitoring of Narrow-band All-dielectric Thin-film Optical Filters
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1. Production Methods and Thin-Film Materials;Thin-Film Optical Filters, Fourth Edition;2010-03-16
2. Manufacture and spectral assessment of the filters and antireflection coatings for use in the HIRDLS instrument;SPIE Proceedings;1998-11-18
3. Monitoring a deposition process using an extended adaptive Kalman filter;IEE Proceedings D Control Theory and Applications;1984
4. Cut-on interference filter for the 8–11.7 μm region;Vacuum;1983-04
5. 4.1 The monitoring of thin films for optical purposes;Vacuum;1977-06
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