Physical and electrical properties’ evaluation of SnS:Cu thin films-Reference-Cited by-同舟云学术

Physical and electrical properties’ evaluation of SnS:Cu thin films

Published:2020-04-24 Issue:2 Volume:37 Page:137-147
ISSN:0267-0844
Container-title:Surface Engineering
language:en
Short-container-title:Surface Engineering

Author:

Sebastian S.¹^ORCID,Kulandaisamy I.¹,Valanarasu S.¹,Shkir Mohd²^ORCID,Ganesh V.²,Yahia I. S.²³^ORCID,Kim Hyun-Seok⁴^ORCID,Vikraman Dhanasekaran⁴^ORCID

Affiliation:

1. PG & Research Department of Physics, Arul Anandar College, Madurai, India

2. Advanced Functional Materials & Optoelectronic Laboratory (AFMOL), Department of Physics, Faculty of Science, King Khalid University, Abha, Saudi Arabia

3. Nanoscience Laboratory for Environmental and Bio-medical Applications (NLEBA), Physics Department, Faculty of Education, Ain Shams University, Cairo, Egypt

4. Division of Electronics and Electrical Engineering, Dongguk University-Seoul, Seoul, Republic of Korea

Funder

King Khalid University

National Research Foundation of Korea

Ministry of Education

Ministry of Education, Science and Technology and ICT

Publisher

Informa UK Limited

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

https://www.tandfonline.com/doi/pdf/10.1080/02670844.2020.1754623