Depth profiling of ion-induced damage in D9 alloy using X-ray diffraction-Reference-Cited by-同舟云学术

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Depth profiling of ion-induced damage in D9 alloy using X-ray diffraction

Published:2018-02-22 Issue:3-4 Volume:173 Page:300-317
ISSN:1042-0150
Container-title:Radiation Effects and Defects in Solids
language:en
Short-container-title:Radiation Effects and Defects in Solids

Author:

Dey S.¹,Gayathri N.¹,Mukherjee P.¹

Affiliation:

1. Variable Energy Cyclotron Centre, HBNI, Kolkata, India

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation

Link

https://www.tandfonline.com/doi/pdf/10.1080/10420150.2018.1438435

Reference46 articles.

1. Radiation Effects in Advanced Semiconductor Materials and Devices

2. Radiation Effects in Solids

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. PKA Energy dependence of defect evolution in ion irradiated Fe-15Ni-15Cr alloy – a successive cascade study using molecular dynamics simulation;Radiation Effects and Defects in Solids;2024-02-13

2. Effect of Y ions incorporation on structural, morphological and magnetic properties of Bi1−xDyxFeO3 for ferromagnetic applications;Bulletin of Materials Science;2021-07-20

3. Characterization of ion induced damage as a function of depth in proton irradiated pure Ti and Ti–6Al–4V;Journal of Alloys and Compounds;2020-04

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