Synthesis and characterization of nc-Ge embedded in SiO2/Si matrix-Reference-Cited by-同舟云学术

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Synthesis and characterization of nc-Ge embedded in SiO2/Si matrix

Published:2009-08 Issue:7-8 Volume:164 Page:452-459
ISSN:1042-0150
Container-title:Radiation Effects and Defects in Solids
language:en
Short-container-title:Radiation Effects and Defects in Solids

Author:

Srinivasa Rao N.,Dhamodaran S.,Pathak A. P.,Kabiraj D.,Khan S. A.,Panigrahi B. K.,Nair K. G.M.,Sundaravel B.,Pivin J. C.,Avasthi D. K.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation

Link

http://www.tandfonline.com/doi/pdf/10.1080/10420150902949845

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Enhanced Photoluminescence Intensity of Silicon–Germanium Nanoparticles: Silica Thin Films by Annealing in Forming Gas;Spectroscopy Letters;2014-08-08

2. SHI Effects On Ge+SiO[sub 2] Composite Films Prepared By RF Sputtering;AIP Conference Proceedings;2011

3. SHI for Synthesis and Modifications of Nanostructured Materials;Swift Heavy Ions for Materials Engineering and Nanostructuring;2011

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